L X-ray production cross sections of medium Z elements by 4He ion impact
Creators
- 1. National Univ. of Singapore (Singapore). Dept. of Physics
Description
L X-ray production cross sections for 500, 600, 800 and 1000 keV 4He ions incident upon 47Ag, 49In, 50Sn, 51Sb, 52Te, and 58Ce targets are reported. Commercially available evaporated thin metal foils with thicknesses ranging between 45 and 160 μg/cm2 were used. The experimental values of L X-ray production cross sections are compared to the predictions of the first Born and ECPSSR theories. The first Born approximation overpredicts the experimental values of all measured production cross sections for all elements and energies. ECPSSR theory underpredicts Lα, Lβ and Lγ1,5 production cross sections for all elements except for Ce. Discrepancy is clearly larger at lower ion energies. On the other hand Lγ2,3 is generally in good agreement with the ECPSSR theory. Only a very limited number of data for the same elements and energies as measured in this work are found in literature and compared with our values. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 136-138
- Journal Page Range
- p. 184-188
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on ion beam analysis (IBA-13)
- Dates
- 27 Jul - 1 Aug 1997
- Place
- Lisbon (Portugal)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 29042316
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTIMONY; ATOM COLLISIONS; CERIUM; HELIUM IONS; INDIUM; INNER-SHELL IONIZATION; ION MICROPROBE ANALYSIS; NUCLEI; NUMERICAL ANALYSIS; RADIATION DETECTORS; RUTHERFORD SCATTERING; SILVER; TELLURIUM; THIN FILMS; TIN; X-RAY DETECTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; COLLISIONS; DETECTION; ELASTIC SCATTERING; ELEMENTS; FILMS; IONIZATION; IONS; MATHEMATICS; MEASURING INSTRUMENTS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; RARE EARTHS; SCATTERING; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Notes
- 20 refs.