EUV spectroscopy of highly charged xenon ions
- 1. Institut fuer Physik der Humboldt-Universitaet zu Berlin, Lehrstuhl Plasmaphysik, Newtonstrasse 15, D-12489 Berlin (Germany) and Max-Planck-Institut fuer Plasmaphysik, EURATOM Association (Germany)
- 2. Max-Planck-Institut fuer Plasmaphysik, EURATOM Association (Germany)
- 3. Institut fuer Physik der Humboldt-Universitaet zu Berlin, Lehrstuhl Plasmaphysik, Newtonstrasse 15, D-12489 Berlin (Germany)
- 4. Racah Institute of Physics, Hebrew University, 91904 Jerusalem (Israel)
Description
At the Berlin Electron Beam Ion Trap facility we investigated the radiation of highly charged xenon ions in the extreme ultraviolet wavelength range using a 2 m grazing incidence spectrometer. For Rb-like Xe17+ to Cu-like Xe25+ ions 37 individual lines have been registered in the range between 90 and 240 A and identified by performing atomic structure calculations with the HULLAC code. The 4s-4p resonance lines of Cu-like and Zn-like Xe ions are found to be in good agreement with measurements at tokamaks and MCDF calculations. The experimental wavelengths for ions involving a larger number of electrons in the n = 4 shell deviate slightly from the predicted values. Several lines observed with the BerlinEBIT had been previously seen but not identified at the tokamak and can now be classified
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.03.158;
- PII
- S0168-583X(05)00382-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 235
- Journal Issue
- 1-4
- Journal Page Range
- p. 126-130
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 12. international conference on the physics of highly charged ions
- Acronym
- HCI-2004
- Dates
- 6-11 Sep 2004
- Place
- Vilnius (Lithuania)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37019300
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON BEAMS; ELECTRONS; EXTREME ULTRAVIOLET RADIATION; GRAZING; PLASMA DIAGNOSTICS; SPECTROSCOPY; TOKAMAK DEVICES; ULTRAVIOLET SPECTROMETERS; WAVELENGTHS; XENON IONS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FEEDING; FERMIONS; IONS; LEPTON BEAMS; LEPTONS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATIONS; SPECTROMETERS; THERMONUCLEAR DEVICES; ULTRAVIOLET RADIATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.