Published January 2009 | Version v1
Journal article

Microbeam of 200 keV x-ray with sputtered-sliced zone plate

  • 1. Kansai Medical Univ., Hirakata, Osaka (Japan)
  • 2. Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo (Japan)
  • 3. National Inst. of Advanced Industrial Science and Technology, Photonic Research Institute, Ikeda, Osaka (Japan)

Description

The microfocusing of 200 keV X-rays with a sputtered-sliced zone plate (ss-FZP) was performed at the wiggler beamline (BL08W, Station A) at SPring-8. The ss-FZP used was the same as that used in the 100 keV X-ray focusing experiment previously reported. The minimum focal spot size attained for the first-order focal beam was ∼5 μm with a focal distance of 1720 mm at a photon energy of 200 keV. (author)

Additional details

Identifiers

Publishing Information

Journal Title
Japanese Journal of Applied Physics
Journal Volume
48
Journal Issue
1
Journal Page Range
p. 010219.1-010219.3
ISSN
0021-4922

Optional Information

Notes
Available from doi: http://dx.doi.org/10.1143/JJAP.48.010219; 12 refs., 4 figs.