Published April 1, 2011 | Version v1
Journal article Metadata-only

A method for measuring exchange stiffness in ferromagnetic films

Creators

  • 1. Simon Fraser University, Burnaby, 8888 University Drive, British Columbia V5A 1S6 (Canada)
  • 2. University of Alabama, Tuscaloosa, Alabama 35487 (United States)
  • 3. One Bungtown Road, Cold Spring Harbor, New York 11724 (United States)
  • 4. Uppsala University, P.O. Box 256, SE-751 05 Uppsala (Sweden)

Description

An exchange stiffness, Aex, in ferromagnetic films is obtained by fitting the M(H) dependence of two ferromagnetic layers antiferromagnetically coupled across a nonmagnetic spacer layer with a simple micromagnetic model. In epitaxial and textured structures this method allows measuring Aex between the crystallographic planes perpendicular to the growth direction of ferromagnetic films. Our results show that Aex between [0001] planes in textured Co grains is 1.54 ± 0.12 x 10-11 J/m.

Additional details

Identifiers

DOI
10.1063/1.3565203;

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
109
Journal Issue
7
Journal Page Range
p. 07B765-07B765.3
ISSN
0021-8979
CODEN
JAPIAU

Conference

Title
55. annual conference on magnetism and magnetic materials
Dates
14-18 Nov 2010
Place
Atlanta, GA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43037652
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COBALT; CRYSTALLOGRAPHY; ELECTRONS; EPITAXY; EXCHANGE INTERACTIONS; FERROMAGNETIC MATERIALS; FLEXIBILITY; LAYERS; THIN FILMS
Descriptors DEC
CRYSTAL GROWTH METHODS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; INTERACTIONS; LEPTONS; MAGNETIC MATERIALS; MATERIALS; MECHANICAL PROPERTIES; METALS; TENSILE PROPERTIES; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2011 American Institute of Physics