Resonant two-electron processes in ion-atom collisions
Creators
Description
A review of some of the recent results in an effort to obtain electron-ion differential scattering cross sections using fast ion-atom collisions is given. In the projectile frame, if we neglect the effects from the target nucleus, the ion-atom collision can be described as an electron-ion scattering process where the energy distribution of the impinging quasi-free electrons is determined by the Compton-profile of the target. In this electron scattering model (ESM), in addition to the direct electron scattering, doubly excited state formation of the projectile ion is also possible. This is a resonant process in which the doubly excited states can subsequently decay by ejecting Auger-electrons. We have studied elastic, inelastic and superelastic electron scattering as a function of incoming electron energy by observing the outgoing electron energy in the ion-atom collision emission spectra
Additional details
Identifiers
- PII
- S0168583X99000063;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 154
- Journal Issue
- 1-4
- Journal Page Range
- p. 153-165
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33044627
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- AUGER EFFECT; DIFFERENTIAL CALCULUS; DIFFERENTIAL CROSS SECTIONS; ELECTRON EMISSION; ELECTRONS; EXCITATION; ION-ATOM COLLISIONS; SCATTERING
- Descriptors DEC
- ATOM COLLISIONS; COLLISIONS; CROSS SECTIONS; ELEMENTARY PARTICLES; EMISSION; ENERGY-LEVEL TRANSITIONS; FERMIONS; ION COLLISIONS; LEPTONS; MATHEMATICS
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.