Published November 21, 2009 | Version v1
Journal article Metadata-only

Counterintuitive assignment of the lines observed by x-ray photoelectron spectroscopy at the hydrogen-terminated (1 0 0) surface of silicon

Creators

  • 1. Department of Materials Science, University of Milano-Bicocca, Via Cozzi 53, 20125 Milano (Italy)
  • 2. Department of Chemistry, University of Perugia, Via Elce di Sotto 8, 75100 Perugia PG (Italy)

Description

Net-charge analysis, involving siladamantane moieties as local models of various surface silicon atoms, is used in combination with infrared spectroscopy to assign chemical species to the features observed in the x-ray photoelectron spectra from hydrogen-terminated (1 0 0) Si prepared by HFaq etching of the native oxide.

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/42/22/225301

Additional details

Identifiers

DOI
10.1088/0022-3727/42/22/225301;
PII
S0022-3727(09)18288-8;

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
42
Journal Issue
22
Journal Page Range
[7 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42065957
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
ABSORPTION SPECTROSCOPY; ATOMS; CRYSTAL STRUCTURE; ETCHING; HYDROGEN; INFRARED SPECTRA; OXIDES; SILICON; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CHALCOGENIDES; ELECTRON SPECTROSCOPY; ELEMENTS; NONMETALS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SEMIMETALS; SPECTRA; SPECTROSCOPY; SURFACE FINISHING