Published July 2010
| Version v1
Journal article
Total efficiency of GE detectors-dead layer signal effect
Creators
- 1. Czech Metrology Institute, Radiova 1, CZ-102 00 Prague 10 (Czech Republic)
- 2. Institute of Physics, Savanoriu ave. 231, LT-02300 Vilnius (Lithuania)
Description
Two types of detectors (GC 4018 and BE 5030) were compared regarding the signal from the outer dead layer of the detector. γ-spectra of Am-241were acquired with various delays against the starting signal from an alpha LS probe. Coincidence spectra from both detectors were different. The dead-layer signal does not increase the full-energy peak efficiency but it increases the total efficiency, as it was demonstrated by the reconstruction of Am-241 spectra for both detectors.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apradiso.2009.11.026Additional details
Identifiers
- DOI
- 10.1016/j.apradiso.2009.11.026;
- PII
- S0969-8043(09)00715-5;
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 68
- Journal Issue
- 7-8
- Journal Page Range
- p. 1451-1453
- ISSN
- 0969-8043
- CODEN
- ARISEF
Conference
- Title
- 17. international conference on radionuclide metrology and its applications
- Acronym
- ICRM 2009
- Dates
- 7-11 Sep 2009
- Place
- Bratislava (Slovakia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42012681
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMERICIUM 241; COINCIDENCE SPECTROMETRY; EFFICIENCY; GAMMA SPECTRA; HIGH-PURITY GE DETECTORS; LAYERS
- Descriptors DEC
- ACTINIDE NUCLEI; ALPHA DECAY RADIOISOTOPES; AMERICIUM ISOTOPES; COINCIDENCE METHODS; COUNTING TECHNIQUES; GE SEMICONDUCTOR DETECTORS; HEAVY NUCLEI; ISOTOPES; MEASURING INSTRUMENTS; NUCLEI; ODD-EVEN NUCLEI; RADIATION DETECTORS; RADIOISOTOPES; SEMICONDUCTOR DETECTORS; SPECTRA; SPONTANEOUS FISSION RADIOISOTOPES; YEARS LIVING RADIOISOTOPES
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.