Published 2010
| Version v1
Journal article
Possibility for measurement of nanocrystal size with use of parametric x-ray radiation
Description
The natural spectral peak width of the parametric X-ray radiation (PXR) from a thin crystal and the spectral peak width due to experimental angular resolution are considered. The conditions when the natural spectral peak width exceeds the width due to experimental angular resolution are found. A possibility for application of the PXR for measurements of the thickness of a thin crystalline layer in nanometer range is shown and experimental layout at electron accelerator is discussed.
Additional details
Additional titles
- Original title (Russian)
-
Возможность измерения размеров нанокристаллов с помощью параметрического рентгеновского излучения
Publishing Information
- Journal Title
- Voprosy Atomnoj Nauki i Tekhniki
- Journal Issue
- no.2/66
- Journal Page Range
- p. 197-199
- ISSN
- 1562-6016
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 42008032
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; ELECTRON BEAMS; LAYERS; MEV RANGE 10-100; MONOCRYSTALS; NANOSTRUCTURES; THICKNESS; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTRA
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIMENSIONS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; ENERGY RANGE; IONIZING RADIATIONS; LEPTON BEAMS; MEV RANGE; PARTICLE BEAMS; RADIATIONS; SCATTERING; SPECTRA