Published November 28, 2014 | Version v1
Journal article

Temperature dependent dielectric function and reflectivity spectra of nonpolar wurtzite AlN

  • 1. Institute of Experimental Physics, Otto von Guericke University Magdeburg, Universitätsplatz 2, 39106 Magdeburg (Germany)
  • 2. Institut für Quantenmaterie/Gruppe Halbleiterphysik, Universität Ulm, Albert-Einstein-Allee 45, 89069 Ulm (Germany)
  • 3. Leibniz-Institut für Analytische Wissenschaften – ISAS – e.V., Albert-Einstein-Str. 9, 12489 Berlin (Germany)
  • 4. Leibniz Institute for Crystal Growth, Max-Born-Strasse 2, 12489 Berlin (Germany)

Description

Exciton resonances are observed in the dielectric functions of wurtzite AlN by spectroscopic ellipsometry for the electric field vector parallel and perpendicular to the optical axis. The temperature dependence of these excitons is analyzed in detail. From the dielectric functions, reflectivity spectra are calculated and compared to experimentally obtained reflectivity, perfect agreement is found. The relative oscillator strengths of excitons showing different symmetries are discussed yielding an unambiguous assignment of free excitons formed by holes from the highest valence band. As a consequence, a negative exciton spin-exchange coupling constant of j = − 4 meV is derived. - Highlights: • Anisotropic dielectric function of wurtzite AlN obtained as a function of temperature • Reflectivity measurements performed as a function of temperature • Comparison of both types of spectra yields perfect agreement • In-depth analysis of resonance energies yields an assignment of free exciton symmetry

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2013.10.092

Additional details

Identifiers

DOI
10.1016/j.tsf.2013.10.092;
PII
S0040-6090(13)01703-3;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
571
Journal Issue
Part 3
Journal Page Range
p. 502-505
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. international conference on spectroscopic ellipsometry
Acronym
ICSE-VI
Dates
26-31 May 2013
Place
Kyoto (Japan)

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.