Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate
Creators
- 1. School of Astronautics, Harbin Institute of Technology, Harbin 150001 (China)
- 2. Department of Mechanical and Aerospace Engineering, University of Miami, Coral Gables, FL 33146 (United States)
Description
Surface effects are important to predict the mechanical behavior of nanostructures. In this paper, the wrinkling of a stiff thin film bonded to a compliant substrate is studied using an energy method accounting for surface elasticity and residual surface tension. The wavelength, critical buckling strain and amplitude are obtained analytically. These results provide valuable guide to the precise design and control of the wrinkling profile in many applications ranging from stretchable electronics to micro/nano scale surface patterning and precision metrology. - Highlights: ► We studied surface effects on the wrinkling of thin films on compliant substrates. ► The wavelength, critical strain and amplitude are obtained analytically. ► Surface effects are characterized by two non-dimensional parameters.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.11.085Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.11.085;
- PII
- S0040-6090(11)02099-2;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 6
- Journal Page Range
- p. 2077-2079
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108672
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; AMPLITUDES; CONTROL; ELASTICITY; NANOSTRUCTURES; STRAINS; SUBSTRATES; SURFACE TENSION; SURFACES; THIN FILMS
- Descriptors DEC
- FILMS; MECHANICAL PROPERTIES; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.