Published September 1, 2009
| Version v1
Journal article
High resolution projection X-ray microscope equipped with fluorescent X-ray analyzer and its applications
Creators
- 1. TOHKEN CO., LTD., X-ray R and D Department, 2-27-7 Tamagawa Chofu, Tokyo 182-0025 (Japan)
Description
We have newly developed an open type fine-focus X-ray tube 'TX-510' to realize a spatial resolution of 50nm and to radiate low energy characteristic X-rays for giving high absorption contrast to images of microscopic organisms. The 'TX-510' employs a ZrO/W(100) Schottky emitter and an 'In-Lens Field Emission Gun'. The key points of the improvements are (1) reduced spherical aberration coefficient of magnetic objective lens, (2) easy and accurate focusing, (3) newly designed astigmatism compensator, (4) segmented thin film target for interchanging the target materials by electron beam shift and (5) fluorescent X-ray analysis system.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/186/1/012010Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 186
- Journal Issue
- 1
- Journal Page Range
- [3 p.]
- ISSN
- 1742-6596
Conference
- Title
- 9. international conference on X-ray microscopy
- Dates
- 21-25 Jul 2008
- Place
- Zurich (Switzerland)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42027429
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; ELECTRON BEAMS; FIELD EMISSION; GEOMETRICAL ABERRATIONS; IMAGES; LENSES; MICROSCOPES; SPATIAL RESOLUTION; THIN FILMS; X RADIATION; X-RAY DETECTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY TUBES; ZIRCONIUM OXIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; EMISSION; EQUIPMENT; FILMS; IONIZING RADIATIONS; LEPTON BEAMS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; RADIATION DETECTION; RADIATIONS; RESOLUTION; SORPTION; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS; X-RAY EQUIPMENT; ZIRCONIUM COMPOUNDS