Published September 1, 2009 | Version v1
Journal article

High resolution projection X-ray microscope equipped with fluorescent X-ray analyzer and its applications

  • 1. TOHKEN CO., LTD., X-ray R and D Department, 2-27-7 Tamagawa Chofu, Tokyo 182-0025 (Japan)

Description

We have newly developed an open type fine-focus X-ray tube 'TX-510' to realize a spatial resolution of 50nm and to radiate low energy characteristic X-rays for giving high absorption contrast to images of microscopic organisms. The 'TX-510' employs a ZrO/W(100) Schottky emitter and an 'In-Lens Field Emission Gun'. The key points of the improvements are (1) reduced spherical aberration coefficient of magnetic objective lens, (2) easy and accurate focusing, (3) newly designed astigmatism compensator, (4) segmented thin film target for interchanging the target materials by electron beam shift and (5) fluorescent X-ray analysis system.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/186/1/012010

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
186
Journal Issue
1
Journal Page Range
[3 p.]
ISSN
1742-6596

Conference

Title
9. international conference on X-ray microscopy
Dates
21-25 Jul 2008
Place
Zurich (Switzerland)