Simultaneous measurement of the strain tensor of 10 individual grains embedded in an Al tensile sample
Description
First results are presented on the simultaneous observation of the elastic strain tensor as a function of load of 10 individual grains, deeply embedded in the bulk of a polycrystalline Al tensile sample. The experimental technique is based on the use of focused high energy synchrotron radiation in transmission geometry. After each load step diffraction patterns are collected with a large-area X-ray detector system for a series of different angular and lateral sample positions. An automated indexing routine was used to assign sets of diffraction spots to individual grains. The strain tensor components as well as the individual grain position within the sample were then fitted from the diffraction spot positions. A maximum tensile load of 48 MPa was applied. Deviations in strain of up to 600 x 10-6 are observed between respective strain components of individual grains
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2004.02.069;
- PII
- S0921509304004551;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 387-389
- Journal Issue
- 2-3
- Journal Page Range
- p. 84-88
- ISSN
- 0921-5093
- CODEN
- MSAPE3
Conference
- Title
- 13. international conference on the strength of materials
- Dates
- 25-30 Aug 2003
- Place
- Budapest (Hungary)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38055524
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FUNCTIONS; GEOMETRY; POLYCRYSTALS; STRAINS; STRESSES; SYNCHROTRON RADIATION; TENSORS; TRANSMISSION; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATHEMATICS; RADIATIONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.