Published December 15, 2004 | Version v1
Journal article

Simultaneous measurement of the strain tensor of 10 individual grains embedded in an Al tensile sample

Description

First results are presented on the simultaneous observation of the elastic strain tensor as a function of load of 10 individual grains, deeply embedded in the bulk of a polycrystalline Al tensile sample. The experimental technique is based on the use of focused high energy synchrotron radiation in transmission geometry. After each load step diffraction patterns are collected with a large-area X-ray detector system for a series of different angular and lateral sample positions. An automated indexing routine was used to assign sets of diffraction spots to individual grains. The strain tensor components as well as the individual grain position within the sample were then fitted from the diffraction spot positions. A maximum tensile load of 48 MPa was applied. Deviations in strain of up to 600 x 10-6 are observed between respective strain components of individual grains

Additional details

Identifiers

DOI
10.1016/j.msea.2004.02.069;
PII
S0921509304004551;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
387-389
Journal Issue
2-3
Journal Page Range
p. 84-88
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
13. international conference on the strength of materials
Dates
25-30 Aug 2003
Place
Budapest (Hungary)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38055524
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FUNCTIONS; GEOMETRY; POLYCRYSTALS; STRAINS; STRESSES; SYNCHROTRON RADIATION; TENSORS; TRANSMISSION; X RADIATION; X-RAY DIFFRACTION
Descriptors DEC
BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATHEMATICS; RADIATIONS; SCATTERING

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.