SECCOX, a novel x-ray characterization bench for Bragg crystals and x-rays optics
- 1. C.E.A. Centre d'Etudes Scientifiques et Techniques d'Aquitaine, 33114 LE BARP (France)
- 2. CELIA, Universite de Bordeaux 1, 351 cours de la liberation, 33400 Talence (France)
- 3. Saint-Gobain Crystals, B.P. 521, Nemours Cedex (France)
Description
Laser programs require the use of a large number of calibrated x-ray crystals implemented inside spectrometers and microscopes used in diagnostics. In this context, a new apparatus was designed in collaboration with CELIA laboratory, Saint-Gobain Crystals and Detectors and CEA to characterize x-ray Bragg crystals. Station d'Etude et de Caracterisation des Cristaux pour les Optiques X (SECCOX) is based on a micrometric x-ray source and an automated spectrometer equipped with a CCD camera. Properties such as homogeneity, resolution, radius of curvature and reflectivity are measured to guarantee diagnostic performance in laser-plasma physics experiments. We will present the experimental device, techniques and results of the calibration obtained. (authors)
Availability note (English)
Available from doi:Additional details
Identifiers
- DOI
- 10.1002/xrs.968;
Publishing Information
- Journal Title
- X-Ray Spectrometry, XRS
- Journal Volume
- 36
- Journal Issue
- 4
- Journal Page Range
- p. 264-269
- ISSN
- 0049-8246
Conference
- Title
- 12. European X-ray Spectrometry Conference
- Acronym
- EXRS 2006
- Dates
- 19-23 Jun 2006
- Place
- Paris (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- France
- INIS RN
- 40085143
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALIBRATION; CAMERAS; CEA; CRYSTALS; EQUIPMENT; LASERS; MICROSCOPES; PERFORMANCE; PLASMA; REFLECTIVITY; SPECTROMETERS; X RADIATION; X-RAY SOURCES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; FRENCH ORGANIZATIONS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SURFACE PROPERTIES
Optional Information
- Notes
- 7 refs