CT technology combined with MC simulation efficiency of detector calibration curve

The detector efficiency is directly related to the accuracy of the results of the physical measurements. The integrity and accuracy of the detector structure data are limited by the manufacturer, led to the result that the establishment of a Monte Carlo model cannot be completed. Using computer tomography apparatus (CT), completely internal detector 3D, 2D structure diagram can be obtained, which can be recover all the relevant structural parameters. The experimental results show that: the maximum resolution is better than 1 um by using Xview X5000 industrial CT measurement system, the relative error of the actual parameters is within l.5%; in addition, using different gray color highlights the structure distribution, the establishment of 2D profile by 3D slices, can accurately obtain the shape, position, size and other information of the detector. As approved by the Monte Carlo simulation, detection and structure analysis of object defects can be strongly guaranteed. (authors)