Characterization of X-ray detection system and its application in the search of contaminations in nuclear astrophysics targets

We have already prepared two implanted targets (¹⁴N and ²²Ne) and characterized them (both surface and bulk) using X-ray photo electron spectroscopy (XPS), Scanning electron microscope (SEM), Rutherford backscattering Spectroscopy (RBS) and nuclear resonance reaction. It can also be possible to characterize the target surface by detecting the characteristic X-ray emitted from the excited target atom. These atoms can be excited by bombarding charge particles, X-rays or gamma rays. In our laboratory we have procured an X-ray source and a X-ray detection system from Moxtek, USA. Our primary motivation is to use this set up to characterize our targets to be used in nuclear astrophysics experiments. In this present work, we have tested the performance of the detector for different shaping time, system dead time. We have also performed some elemental analysis using known sample to validate our system