Published 1991 | Version v1
Miscellaneous Metadata-only

Characterization of interfaces by x-ray smoothing incidence in dispersive mode

Creators

  • 1. Sao Paulo Univ., SP (Brazil). Inst. de Fisica

Description

Published in summary form only

Additional details

Additional titles

Original title (Portuguese)
Caracterizacao de interfaces por incidencia rasante de raios x em modo dispersivo

Publishing Information

Imprint Title
Proceedings of the 14. National Meeting on Condensed Matter Physics. v.2
Imprint Pagination
201 p.
Journal Page Range
p. 377.
Report number
INIS-BR--2933

Conference

Title
14. National Meeting on Condensed Matter Physics.
Dates
7-11 May 1991.
Place
Caxambu, MG (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
23081852
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
COBALT; CRYSTAL STRUCTURE; DENSITY; GERMANIUM; INDIUM PHOSPHIDES; INTERFACES; POSITION SENSITIVE DETECTORS; SILICON; THIN FILMS; X RADIATION; X-RAY SOURCES
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; INDIUM COMPOUNDS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SEMIMETALS; TRANSITION ELEMENTS

Optional Information

Notes
Imprint:Anais do 14. Encontro Nacional de Fisica da Materia Condensada. v. 2.