Published March 1, 2007 | Version v1
Journal article

High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP

  • 1. Atomic Physics, AlbaNova, Stockholm University, S-106 91 Stockholm (Sweden)
  • 2. Manne Siegbahn Laboratory, Frescativaegen 28, S-104 05 Stockholm (Sweden)
  • 3. Johannes Gutenberg-University Mainz, Staudingerweg 7, D-55128 Mainz (Germany)

Description

The Penning trap mass spectrometer SMILETRAP takes advantage of highly-charged ions for high-accuracy mass measurements. In this paper recent mass measurements on Li and Ca ions are presented and their impact on fundamental applications discussed, especially the need for accurate mass values of hydrogen-like and lithium-like ions in the evaluation of the electron g-factor measurements in highly-charged ions is emphasized. Such experiments aim to test bound state quantum electrodynamics. Here the ionic mass is a key ingredient, which can be the limiting factor for the final precision

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
58
Journal Issue
1
Journal Page Range
p. 109-112
ISSN
1742-6596

Conference

Title
13. international conference on the physics of highly charged ions
Dates
28 Aug - 1 Sep 2006
Place
Belfast, Northern Ireland (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38074979
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; BOUND STATE; CALCIUM IONS; ELECTRONS; EVALUATION; LANDE FACTOR; LITHIUM IONS; MASS; MULTICHARGED IONS; QUANTUM ELECTRODYNAMICS; TRAPS
Descriptors DEC
CHARGED PARTICLES; DIMENSIONLESS NUMBERS; ELECTRODYNAMICS; ELEMENTARY PARTICLES; FERMIONS; FIELD THEORIES; IONS; LEPTONS; QUANTUM FIELD THEORY