Published September 1, 2011 | Version v1
Journal article

Electron-emission properties of carbon nanotube micro-tips coated by amorphous carbon nitride films

  • 1. Department of Electronic, Electrical, Control and Instrumentation Engineering, Hanyang University, 1271 Sa-3dong, Sangnok-gu, Ansan, Gyeonggi-do 426-791 (Korea, Republic of)
  • 2. Innovation Materials/Device Research Center, Korea Electrotechnology Research Institute, 70 Boolmosangil, Seongsan-gu, Changwon 641-120 (Korea, Republic of)

Description

An approach to the preparation of a tip-type of field emitter that is made up of carbon nanotubes (CNTs) coated with amorphous carbon nitride (a-CNx) films is presented for the purpose of enhancing its electron emission property. CNTs were directly grown on nano-sized conical-type tungsten tips via the inductively coupled plasma-chemical vapor deposition system, and a-CNx films were coated on the CNTs using an radio frequency magnetron sputtering system. The morphologies and microstructures of the a-CNx-coated CNTs were analyzed via field emission scanning electron microscopy, energy-dispersive x-ray spectroscopy, high-resolution transmission electron microscopy, and x-ray photoelectron spectroscopy. The electron emission properties of the a-CNx/CNT hetero-structures were measured using a high-vacuum field emission measurement system. The best field emission properties, such as a very low turn-on voltage of 500 V and a maximum emission current of 176 μA were achieved for the CNT emitter coated with the 5 nm-thick a-CNx film. In addition, this emitter showed a highly stable behavior in long-term (up to 25 h) electron emission.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2011.05.046

Additional details

Identifiers

DOI
10.1016/j.tsf.2011.05.046;
PII
S0040-6090(11)01191-6;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
519
Journal Issue
22
Journal Page Range
p. 7899-7903
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.