Published April 5, 2006
| Version v1
Journal article
Localization theory of surface exciton polaritons on a rough semiconductor surface
Creators
- 1. Department of Physics, Huazhong University of Science and Technology, Wuhan 430074 (China)
Description
We develop a numerical model to investigate the localization of surface exciton polaritons in the presence of random roughness and spatial dispersion. The localization criteria are examined. The localization effects are embodied in the large enhancement and rapid decay of the field intensity on the surface. The calculation shows that there is a transition from the localized state to the extended state. It has been found that the localization occurs in a limited frequency range above the resonant frequency of transverse excitons
Availability note (English)
Available online at http://stacks.iop.org/0953-8984/18/3409/cm6_13_009.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-8984/18/3409/cm6_13_009.pdf;
- DOI
- 10.1088/0953-8984/18/13/009;
- PII
- S0953-8984(06)12025-1;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 18
- Journal Issue
- 13
- Journal Page Range
- p. 3409-3424
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37061222
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DECAY; EXCITONS; FREQUENCY DEPENDENCE; POLARONS; RANDOMNESS; ROUGHNESS; SEMICONDUCTOR MATERIALS; SURFACES
- Descriptors DEC
- MATERIALS; QUASI PARTICLES; SURFACE PROPERTIES