Published March 24, 1992 | Version v1
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Beam test of a large area silicon drift detector

Creators

  • 1. Consiglio Nazionale delle Ricerche, Milan (Italy)
  • 2. Brookhaven National Lab., Upton, NY (United States)
  • 3. European Organization for Nuclear Research, Geneva (Switzerland)
  • 4. KETEK GmbH, Haimhausen (Germany)
  • 5. Technische Univ. Muenchen (Germany)
  • 6. Rockefeller Univ., New York, NY (United States)

Description

The results from the tests of the first large area (4 x 4 cm2) planar silicon drift detector prototype in a pion beam are reported. The measured position resolution in the drift direction is (σ=40 ± 10)μm

Availability note (English)

MF available from INIS under the Report Number; OSTI as DE93005585; NTIS; INIS; US Govt. Printing Office Dep.

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Additional details

Publishing Information

Imprint Pagination
16 p.
Report number
BNL--48136

Conference

Title
6. European symposium on semiconductor detectors.
Dates
24-27 Feb 1992.
Place
Milan (Italy).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
24039134
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; ELECTRONIC EQUIPMENT; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; TESTING
Descriptors DEC
EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS

Optional Information

Contract/Grant/Project number
Contract AC02-76CH00016
Funding organization
USDOE, Washington, DC (United States).
Secondary number(s)
CONF-920299--4; INFN-AE--92/12.