Decoration of MWNTs by CdS Nanoparticles Using Magnetron Sputtering Method
- 1. Islamic Azad University, Department of Physics, Karaj Branch (Iran, Islamic Republic of)
- 2. Islamic Azad University, Plasma Physics Research Centre, Science and Research Branch (Iran, Islamic Republic of)
Description
Carbon nanotubes (CNTs) modified with semiconductor nanocrystalline particles may find wide applications due to their unique properties. Here Cadmium Sulfide (CdS) nanoparticles were successfully grown on Multi-Walled Carbon Nanotubes (MWNTs) via a magnetron sputtering method for the first time. The CdS/MWNTs sample was characterized with X-ray diffraction (XRD), Field Emission Scanning and High Resolution Transmission Electron Microscopies (SEM/TEM) and four point probe. The obtained images show clearly the decoration of the MWNTs by the CdS nanoparticles, and the XRD measurements indicate the CdS structure as hexagonal type. Moreover, the physical properties of the CdS/MWNTs were compared with the physical properties of the CdS nanoparticles grown on the silicon. Electrical measurements of CdS and CdS/MWNTs reveal that CdS/MWNTs has lower resistivity than the CdS sample which may be due to the higher carrier concentrations.
Additional details
Identifiers
Publishing Information
- Journal Title
- Silicon (Print)
- Journal Volume
- 10
- Journal Issue
- 3
- Journal Page Range
- p. 709-714
- ISSN
- 1876-990X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50022082
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CADMIUM SULFIDES; CARBON NANOTUBES; CARRIERS; COMPARATIVE EVALUATIONS; CRYSTALS; IMAGES; MAGNETRONS; NANOPARTICLES; PHYSICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILICON; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- CADMIUM COMPOUNDS; CARBON; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; EVALUATION; INORGANIC PHOSPHORS; MATERIALS; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NANOSTRUCTURES; NANOTUBES; NONMETALS; PARTICLES; PHOSPHORS; SCATTERING; SEMIMETALS; SULFIDES; SULFUR COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Springer Science+Business Media Dordrecht