Published April 2010 | Version v1
Journal article

Microstructure evolution of 6061 O Al alloy during ultrasonic consolidation: An insight from electron backscatter diffraction

  • 1. Department of Earth and Ocean Sciences, University of Liverpool, Liverpool L69 3GP (United Kingdom)
  • 2. Department of Mechanical Engineering, University of Sheffield, Sheffield S1 3JD (United Kingdom)

Description

6061 O Al alloy foils were welded to form monolithic and SiC fibre-embedded samples using the ultrasonic consolidation (UC) process. Contact pressures of 135, 155 and 175 MPa were investigated at 20 kHz frequency, 50% of the oscillation amplitude, 34.5 mm s-1 sonotrode velocity and 20 deg. C. Deformed microstructures were analysed using electron backscatter diffraction (EBSD). At all contact pressures deformation occurs by non-steady state dislocation glide. Dynamic recovery is active in the upper and lower foils. Friction at the welding interface, instantaneous internal temperatures (0.5-0.8 of the melting temperature, Tm), contact pressure and fast strain rates result in transient microstructures and grain size reduction by continuous dynamic recrystallization (CDRX) within the bonding zone. Bonding occurs by local grain boundary migration, which allows diffusion and atom interlocking across the contact between two clean surfaces. Textures weaken with increasing contact pressure due to increased strain hardening and different grain rotation rates. High contact pressures enhance dynamic recovery and CDRX. Deformation around the fibre is intense within 50 μm and extends to 450 μm from it.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2009.12.035

Additional details

Identifiers

DOI
10.1016/j.actamat.2009.12.035;
PII
S1359-6454(09)00883-0;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
58
Journal Issue
7
Journal Page Range
p. 2492-2503
ISSN
1359-6454
CODEN
ACMAFD

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.