Discrimination of Charged Particles in a Neutral Beam Line by Using a Solid Scintillation Detector
Creators
- 1. Jeju National University, Jeju (Korea, Republic of)
Description
In the past several decades, many studies have been conducted to search for non-baryonic dark matter, such as weakly interactive massive particles (WIMPs). In the search for WIMPs, charged particles incident on the detector are background particles because WIMPs are neutral. Charged particles originate from various sources, such as cosmic rays and laboratory materials surrounding the main detector. Therefore, a veto that discriminates charged particles can improve the particle detection efficiency of the entire experiment for detecting WIMPs. Here, we investigate in the thickness range of 1 mm to 5 mm, the optimal thickness of a polystyrene scintillator as a charged particle veto detector. We found that 3-mm-thick polystyrene provides the best performance to veto charged particles and the charged-particle background in the search for the WIMP signal. Furthermore, we fabricated 3-mm-thick and 5-mm-thick polystyrene charged particle veto detectors that will be used in an underground laboratory in the search for WIMP dark matter. After exposing those detectors are the actual beam line, we compared the rate of charged particles measured using those detectors and the rate simulated through a Monte Carlo simulation.
Additional details
Publishing Information
- Journal Title
- Journal of the Korean Physical Society
- Journal Volume
- 70
- Journal Issue
- 2
- Series
- 13 refs, 7 figs, 1 tab
- Journal Page Range
- p. 213-218
- ISSN
- 0374-4884
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 48087353
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- CHARGED PARTICLE DETECTION; CHARGED PARTICLES; MONTE CARLO METHOD; SIGNALS; SIMULATION; SOLID SCINTILLATION DETECTORS; THICKNESS; WIMPS
- Descriptors DEC
- CALCULATION METHODS; DETECTION; DIMENSIONS; ELEMENTARY PARTICLES; MEASURING INSTRUMENTS; POSTULATED PARTICLES; RADIATION DETECTION; RADIATION DETECTORS; SCINTILLATION COUNTERS