Detection of Shape and Depth of Defects in Aluminum Structures Using SQUIDS
- 1. Christopher Newport University, Newport News, Virginia 23606 (United States)
- 2. NASA Langley Research Center, Hampton, VA 23681 (United States)
- 3. Lockheed Martin Space Operation, Hampton, VA 23681 (United States)
Description
We have developed a low temperature SQUID measurement system for detection of defects deep under the surface of aluminum structures using eddy current techniques. The system uses an orthogonal planar inducer with two different excitation frequencies. We have also developed a data analysis software that enabled us to distinguish between round objects (fastener holes), straight defects (cracks) and cracks close to holes simulating cracks around fasteners in aluminum structures. We were able to detect defects that are 8mm below the surface. We have also measured the change in phase of the detected signal as a function of depth of the defect. This relationship can be used to determine the depth of hidden flaws. A similar system using High Temperature SQUID with better spatial resolution was also able to detect cracks close to fastener holes in layered aluminum sample
Additional details
Identifiers
- DOI
- 10.1063/1.1916866;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 760
- Journal Issue
- 1
- Journal Page Range
- p. 1638-1645
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- Conference on review of progress in quantitative nondestructive evaluation
- Dates
- 25-30 Jul 2004
- Place
- Golden, CO (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36094965
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; COMPUTER CODES; CRACKS; DATA ANALYSIS; DEFECTS; DETECTION; EDDY CURRENT TESTING; FASTENERS; SHAPE; SIGNALS; SPATIAL RESOLUTION; SQUID DEVICES
- Descriptors DEC
- ELECTROMAGNETIC TESTING; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MATERIALS TESTING; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; NONDESTRUCTIVE TESTING; RESOLUTION; SUPERCONDUCTING DEVICES; TESTING
Optional Information
- Notes
- (c) 2005 American Institute of Physics