Published April 9, 2005 | Version v1
Journal article

Detection of Shape and Depth of Defects in Aluminum Structures Using SQUIDS

  • 1. Christopher Newport University, Newport News, Virginia 23606 (United States)
  • 2. NASA Langley Research Center, Hampton, VA 23681 (United States)
  • 3. Lockheed Martin Space Operation, Hampton, VA 23681 (United States)

Description

We have developed a low temperature SQUID measurement system for detection of defects deep under the surface of aluminum structures using eddy current techniques. The system uses an orthogonal planar inducer with two different excitation frequencies. We have also developed a data analysis software that enabled us to distinguish between round objects (fastener holes), straight defects (cracks) and cracks close to holes simulating cracks around fasteners in aluminum structures. We were able to detect defects that are 8mm below the surface. We have also measured the change in phase of the detected signal as a function of depth of the defect. This relationship can be used to determine the depth of hidden flaws. A similar system using High Temperature SQUID with better spatial resolution was also able to detect cracks close to fastener holes in layered aluminum sample

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
760
Journal Issue
1
Journal Page Range
p. 1638-1645
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Conference on review of progress in quantitative nondestructive evaluation
Dates
25-30 Jul 2004
Place
Golden, CO (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36094965
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; COMPUTER CODES; CRACKS; DATA ANALYSIS; DEFECTS; DETECTION; EDDY CURRENT TESTING; FASTENERS; SHAPE; SIGNALS; SPATIAL RESOLUTION; SQUID DEVICES
Descriptors DEC
ELECTROMAGNETIC TESTING; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MATERIALS TESTING; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; NONDESTRUCTIVE TESTING; RESOLUTION; SUPERCONDUCTING DEVICES; TESTING

Optional Information

Notes
(c) 2005 American Institute of Physics