High pressure study of Pu0.92Am0.08 binary alloy
- 1. CEA, Valduc, F-21120 Is-sur-Tille (France)
- 2. European Commission JRC, Institute for Transuranium Elements, Postfach 2340, D-76125 Karlsruhe (Germany)
- 3. CEA, DRT/DTMN, F-38054 Grenoble (France)
Description
The phase transitions (by means of x-ray diffraction) and electrical resistivity of a Pu0.92Am0.08 binary alloy were determined under pressure (up to 2 GPa). The evolution of atomic volume with pressure gives detailed information concerning the degree of localization of 5f electronic states and their delocalization process. A quasi-linear V = f(P) dependence reflects subtle modifications of the electronic structure when P increases. The electrical resistivity measurements reveal the very high stability of the δ phase for pressures less than 0.7 GPa, since no martensitic-like transformation occurs at low temperature. Remarkable electronic behaviours have also been observed. Finally, resistivity curves have shown the temperature dependence of the phase transformations together with unexpected kinetic effects
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/20/27/275217Additional details
Identifiers
- DOI
- 10.1088/0953-8984/20/27/275217;
- PII
- S0953-8984(08)74535-1;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 20
- Journal Issue
- 27
- Journal Page Range
- [7 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40029791
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMERICIUM ALLOYS; BINARY ALLOY SYSTEMS; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; MODIFICATIONS; PHASE TRANSFORMATIONS; PLUTONIUM ALLOYS; PRESSURE DEPENDENCE; PRESSURE RANGE GIGA PA; STABILITY; TEMPERATURE DEPENDENCE; TRANSFORMATIONS; X-RAY DIFFRACTION
- Descriptors DEC
- ACTINIDE ALLOYS; ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; PHYSICAL PROPERTIES; PRESSURE RANGE; SCATTERING