Published May 16, 1991
| Version v1
Journal article
Remeasurement of the CuKα1 emission X-ray wavelength in the metrical system (present stage)
- 1. Physikalisch-Astronomische Fakultaet, Jena Univ. (Germany, F.R.)
- 2. Inst. fuer Physik der Erde, Jena (Germany, F.R.)
- 3. Abteilung Atomphysik, Physikalisch-Technische Bundesanstalt, Braunschweig (Germany, F.R.)
Description
Using a crystal which lattice parameter is measured firstly with simultaneous X-ray and optical interferometry in the metrical system and secondly with a diffractometric measurement with respect to the X-ray line the wavelength of the characteristic CuKα1 emission line is remeasured with an accuracy, Δλ/λ of about 3x10-7 in the metrical system. (orig.)
Additional details
Publishing Information
- Journal Title
- Physica Status Solidi A
- Journal Volume
- 125
- Journal Issue
- 1
- Series
- Phys. Status Solidi A.
- Journal Page Range
- 79-89
- ISSN
- 0031-8965
- CODEN
- PSSAB
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 22081893
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPPER; EMISSION; INTERFEROMETERS; INTERFEROMETRY; WAVELENGTHS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; METALS; RADIATIONS; SCATTERING; TRANSITION ELEMENTS