Published December 1988 | Version v1
Journal article Metadata-only

Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation

Creators

  • 1. Los Alamos National Lab., Los Alamos, NM (USA)
  • 2. Sandia National Labs., Albuquerque, NM (USA)

Description

Cumulative fractions for linear energy transfer (LET) spectra have been measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
35
Journal Issue
6
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1629-1633
ISSN
0018-9499
CODEN
IETNA

Conference

Title
25. annual conference on nuclear and space radiation effects.
Dates
12-15 Jul 1988.
Place
Portland, OR (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20050923
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ALGORITHMS; EXPERIMENTAL DATA; IRRADIATION; LET; MATERIALS; MICROELECTRONIC CIRCUITS; MICROELECTRONICS; MONTE CARLO METHOD; NEUTRON TRANSPORT; PACKAGING; PROTON TRANSPORT; THEORETICAL DATA
Descriptors DEC
CHARGED-PARTICLE TRANSPORT; DATA; ELECTRONIC CIRCUITS; ENERGY TRANSFER; INFORMATION; NEUTRAL-PARTICLE TRANSPORT; NUMERICAL DATA; RADIATION TRANSPORT

Optional Information

Secondary number(s)
CONF-880730--.