Published May 1, 2009 | Version v1
Journal article

Annealing behavior of lithium niobate irradiated with He-ions at 100 K

  • 1. Institut fuer Festkoerperphysik, Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, D-07743 Jena (Germany)
  • 2. Leibniz-Institut fuer Oberflaechenmodifzierung e.V., Permoserstrasse 15, D-04318 Leipzig (Germany)

Description

In order to investigate the formation and the annealing of defects, x- and z-cut lithium niobate (LiNbO3) crystals were irradiated with 200 keV He-ions at a temperature of 100 K. Subsequently, thermal treatment was performed at temperatures of 250 deg. C and 300 deg. C, respectively. The defect concentration was measured by means of Rutherford-backscattering spectroscopy (RBS) using 1.4 MeV He-ions immediately after the irradiation at 100 K, after warming to room temperature as well as after thermal treatment. After the irradiation the x-cut crystal is apparently more damaged compared to z-cut which is a consequence of the preferential arrangement of displaced Nb-atoms on vacant octahedral sites. Upon thermal treatment the samples show a completely different annealing behavior. At an ion fluence of 1x1016cm-2, the defect concentration decreases for x-cut material, but increases for z-cut samples with increasing annealing time. This is explained by the formation of aligned dislocation loops during the thermal treatment.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.01.115

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.01.115;
PII
S0168-583X(09)00119-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
8-9
Journal Page Range
p. 1492-1495
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam modification of materials
Dates
31 Aug - 5 Sep 2008
Place
Dresden (Germany)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.