Published 1992 | Version v1
Miscellaneous Metadata-only

Scanning micro-analysis of SiC-Si3N4 material by proton non-rutherford backscattering

Creators

  • 1. LNAT Shanghai Division, SINR (China)
  • 2. Shanghai Inst. of Ceramics (China)

Description

no abstract available

Additional details

Publishing Information

Imprint Title
Laboratory of nuclear analysis techniques academia sinica annual report (1992)
Imprint Pagination
167 p.
Journal Page Range
p. 59

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
29057981
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Non-conventional Literature
Descriptors DEI
BACKSCATTERING; CERAMICS; COMPOSITE MATERIALS; DEPTH; MEV RANGE 01-10; PROTON MICROPROBE ANALYSIS; SILICON CARBIDES; SILICON NITRIDES; SPATIAL DISTRIBUTION
Descriptors DEC
CARBIDES; CARBON COMPOUNDS; CHEMICAL ANALYSIS; DIMENSIONS; DISTRIBUTION; ENERGY RANGE; MATERIALS; MEV RANGE; MICROANALYSIS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; PNICTIDES; SCATTERING; SILICON COMPOUNDS