NanoESCA: imaging UPS and XPS with high energy resolution
Creators
- 1. FOCUS GmbH, Am Birkhecker Berg 20, 65510 Huenstetten (Germany)
- 2. OMICRON Nanotechnology GmbH, 65232 Taunusstein (Germany)
- 3. Universitaet des Saarlandes, FR 7.2. Experimentalphysik, 66041 Saarbruecken (Germany)
- 4. Experimentelle Physik II, Universitaet Wuerzburg, Am Hubland, 97074 Wuerzburg (Germany)
- 5. Johannes Gutenberg Universitaet, Institut fuer Physik, Staudinger Weg 7, 55128 Mainz (Germany)
Description
A novel imaging electron spectrometer has been used for laterally resolved ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS) in the soft X-ray range. The instrument is based on a high-resolution emission microscope optics using a cathode lens and an imaging dispersive analyser. The analyser is corrected for the leading aberration term (α 2-term) by means of two hemispherical analysers in antisymmetric configuration with an appropriate transfer lens. Small-area spectra as well as energy-filtered images have been taken in the soft X-ray range for a meteorite sample and in the range of the d-band of a Cu polycrystal. An energy resolution of 106 meV along with a high spatial resolution allows a detailed analysis of trace elements in the meteorite sample as well as local UPS spectra of the surface of the Cu sample
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2005.01.250;
- PII
- S0368-2048(05)00035-6;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 144-147
- Journal Page Range
- p. 1179-1182
- ISSN
- 0368-2048
- CODEN
- JESRAW
Conference
- Title
- 14. international conference on vacuum ultraviolet radiation physics
- Acronym
- VUV 14
- Dates
- 19-23 Jul 2004
- Place
- Cairns (Australia)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039957
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CATHODES; ELECTRON SPECTRA; ELECTRON SPECTROMETERS; ENERGY RESOLUTION; METEORITES; MULTI-ELEMENT ANALYSIS; OPTICS; PHOTOEMISSION; SOFT X RADIATION; SPATIAL RESOLUTION; SURFACES; TRACE AMOUNTS; ULTRAVIOLET RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTRODES; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; EMISSION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; RESOLUTION; SECONDARY EMISSION; SPECTRA; SPECTROMETERS; SPECTROSCOPY; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.