Published March 1, 2009 | Version v1
Report

Improvements in RIMS isotope precision: applications to in situ atom-limited isotopic analysis

  • 1. Chicago Center for Cosmochemistry, Chicago, IL (United States)
  • 2. Univ.of Chicago, Chicago, IL (United States)
  • 3. Argonne National Laboratory (United States). Materials Science Division

Description

Resonance ionization mass spectrometry offers high sensitivity and elemental selectivity in microanalysis, but the isotopic precision attainable by this technique has been limited. Here we report instrumental modifications to improve the precision of RIMS isotope ratio measurements. Special attention must be paid to eliminating pulse-to-pulse variations in the time-of-flight mass spectrometer through which the photoions travel, and resonant excitation schemes must be chosen such that the resonance transitions can be substantially power-broadened to cover the isotope shifts. We report resonance ionization measurements of chromium isotope ratios with statistics-limited precision better than 1%.

Availability note (English)

Available from American Institute of Physics, College Park, MD (US)

Additional details

Identifiers

Publishing Information

Imprint Pagination
vp.
Report number
ANL/MSD/CP--63162

Conference

Title
2008 Laser Atom Probing Conference
Dates
6-10 Oct 2008
Place
Nagoya (Japan)

Optional Information

Contract/Grant/Project number
AC02-06CH11357
Notes
AIP Conf. Proc. Vol. 1104, pp. 90-95; doi 10.1063/1.3115614
Funding organization
USDOE Office of Science (United States); National Aeronautics and Space Administration (United States)