Published March 1973
| Version v1
Journal article
Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Surface Science
- Journal Volume
- 35
- Series
- Surf. Sci.
- Journal Page Range
- 427-457
- ISSN
- 0039-6028
Conference
- Title
- 2. Symposium of Surface Physics.
- Dates
- 22 Jun 1972.
- Place
- Enschede, Netherlands.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 4086730
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CATALYSTS; CHEMICAL COMPOSITION; ION BEAMS; MASS SPECTROSCOPY; QUANTITATIVE CHEMICAL ANALYSIS; SECONDARY BEAMS; SENSITIVITY; SILVER; SPUTTERING; STRUCTURAL CHEMICAL ANALYSIS; SURFACE PROPERTIES; SURFACES
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ELEMENTS; METALS; PARTICLE BEAMS; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent