Published May 12, 2003 | Version v1
Journal article

Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy

  • 1. Swiss Federal Institute of Technology, ETH Hoenggerberg, Institute for Chemical and Bioengineering, CH-8093 Zurich (Switzerland)
  • 2. Argonne National Laboratory, Advanced Photon Source, Bld. 431, Argonne, Illinois 60439-4856 (United States)
  • 3. European Synchrotron Radiation Facility ESRF, BP 220, F-38043 Grenoble (France)
  • 4. Institute of Materials Science and Department of Physics, Bergische Universitaet Wuppertal, Gaussstr. 20, D-42097 Wuppertal (Germany)
  • 5. II. Physikalisches Institut, Aachen University, D-52056 Aachen (Germany)

Description

Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near-edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
82
Journal Issue
19
Journal Page Range
p. 3360-3362
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35037696
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ABSORPTION SPECTROSCOPY; CHEMICAL ANALYSIS; CHEMICAL STATE; TOMOGRAPHY; X-RAY SPECTROSCOPY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; SPECTROSCOPY

Optional Information

Notes
(c) 2003 American Institute of Physics.