Published 1989 | Version v1
Book

SXRP

  • 1. Columbia Astrophysics Lab., Columbia Univ. (United States)
  • 2. Space Research Inst. of the USSR Academy of Sciences (USSR)
  • 3. Lawrence Livermore National Lab. (United States)
  • 4. NASA/Marshall Space Flight Center (United States)
  • 5. Univ. of California, Irvine, CA (United States)
  • 6. IFCAI/CNR (Italy)
  • 7. Ist. di Astrofisica Spazaile (Italy)
  • 8. Univ. Leicester (United Kingdom)
  • 9. Univ. of Rome (Italy)

Description

In this paper the authors describe an X-ray polarimeter which will be flown on the SPECTRUM-X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson (Compton) scattering from a metallic lithium target, and photoemission from a Cesium Iodide photocathode. The polarimeter is separated into two instruments. One instrument consists of a graphite Bragg crystal, a lithium Thomson scattering target, and four gas proportional chambers for X-ray detection. The other instrument is made up of a CsI photocathode and the associated electron detector. This instrument makes use of the recently discovered polarization dependence of X-ray photoemission from CsI. The polarimeter will make possible sensitive measurements of several hundred known X-ray sources, an increase of two orders of magnitude over the X-ray polarimeters flow to date. These polarization measurements will allow us to constrain the geometry of gas flow in X-ray binaries, differentiate between current models for X-ray emission in radio pulsars, detect nonthermal components in supernova remnants, determine the radiation mechanisms in active galactic nuclei, and search for inertial frame dragging (Lense-Thirring effect) around the putative black hole in Cygnus X-1

Additional details

Additional titles

Subtitle (English)
A focal plane stellar x-ray polarimeter for the SPECTRUM-X-gamma mission

Publishing Information

Publisher
SPIE Society of Photo-Optical Instrumentation Engineers.
Imprint Place
Bellingham, WA (United States)
Imprint Title
X-ray/EUV optics for astronomy and microscopy
Imprint Pagination
670 p.
Journal Page Range
p. 587-597.

Conference

Title
33. SPIE annual international technical symposium on optical and optoelectronic applied science and engineering.
Dates
6-11 Aug 1989.
Place
San Diego, CA (United States).

Optional Information

Secondary number(s)
CONF-890836--.