SXRP
Creators
- 1. Columbia Astrophysics Lab., Columbia Univ. (United States)
- 2. Space Research Inst. of the USSR Academy of Sciences (USSR)
- 3. Lawrence Livermore National Lab. (United States)
- 4. NASA/Marshall Space Flight Center (United States)
- 5. Univ. of California, Irvine, CA (United States)
- 6. IFCAI/CNR (Italy)
- 7. Ist. di Astrofisica Spazaile (Italy)
- 8. Univ. Leicester (United Kingdom)
- 9. Univ. of Rome (Italy)
Description
In this paper the authors describe an X-ray polarimeter which will be flown on the SPECTRUM-X-Gamma mission. The instrument exploits three distinct physical processes to measure polarization: Bragg reflection from a graphite crystal, Thomson (Compton) scattering from a metallic lithium target, and photoemission from a Cesium Iodide photocathode. The polarimeter is separated into two instruments. One instrument consists of a graphite Bragg crystal, a lithium Thomson scattering target, and four gas proportional chambers for X-ray detection. The other instrument is made up of a CsI photocathode and the associated electron detector. This instrument makes use of the recently discovered polarization dependence of X-ray photoemission from CsI. The polarimeter will make possible sensitive measurements of several hundred known X-ray sources, an increase of two orders of magnitude over the X-ray polarimeters flow to date. These polarization measurements will allow us to constrain the geometry of gas flow in X-ray binaries, differentiate between current models for X-ray emission in radio pulsars, detect nonthermal components in supernova remnants, determine the radiation mechanisms in active galactic nuclei, and search for inertial frame dragging (Lense-Thirring effect) around the putative black hole in Cygnus X-1
Additional details
Additional titles
- Subtitle (English)
- A focal plane stellar x-ray polarimeter for the SPECTRUM-X-gamma mission
Publishing Information
- Publisher
- SPIE Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- Imprint Title
- X-ray/EUV optics for astronomy and microscopy
- Imprint Pagination
- 670 p.
- Journal Page Range
- p. 587-597.
Conference
- Title
- 33. SPIE annual international technical symposium on optical and optoelectronic applied science and engineering.
- Dates
- 6-11 Aug 1989.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23068106
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BRAGG REFLECTION; CESIUM IODIDES; COSMIC X-RAY SOURCES; CRYSTAL LATTICES; DESIGN; FABRICATION; GAMMA ASTRONOMY; GRAPHITE; LITHIUM; MULTIWIRE PROPORTIONAL CHAMBER; PERFORMANCE TESTING; PHOTOCATHODES; PHOTOEMISSION; POLARIMETERS; POLARIZATION; PULSARS; STELLAR RADIATION; THOMSON SCATTERING; X-RAY DETECTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALI METALS; ASTRONOMY; CARBON; CATHODES; CESIUM COMPOUNDS; COSMIC RADIO SOURCES; COSMIC RAY SOURCES; CRYSTAL STRUCTURE; DETECTION; ELECTRODES; ELEMENTS; EMISSION; HALIDES; HALOGEN COMPOUNDS; INELASTIC SCATTERING; IODIDES; IODINE COMPOUNDS; MEASURING INSTRUMENTS; METALS; NONMETALS; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; REFLECTION; SCATTERING; SECONDARY EMISSION; TESTING
Optional Information
- Secondary number(s)
- CONF-890836--.