Published February 1, 2010 | Version v1
Journal article

System-level simulation of a X-ray imager with nonlinear gain and per-pixel digitizer: XPCS case study

  • 1. Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg (Germany)

Description

A system-level model of a low-noise high-speed mega-pixel camera with gain compression for X-ray photon correlation spectroscopy experiments at the European XFEL is presented. The model comprises the full signal chain from the sensor element via amplifier/filter and digitizer to the memory. The influence of gain- and offset errors as well as noise on the experiment-relevant image fidelity and intensity correlation function is discussed and compensation techniques are developed. A case study demonstrates the achievable efficiency of the chosen system parameters.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.11.056

Additional details

Identifiers

DOI
10.1016/j.nima.2009.11.056;
PII
S0168-9002(09)02268-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
613
Journal Issue
2
Journal Page Range
p. 323-333
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.