Published May 2006 | Version v1
Journal article

Determination of chromium valence over the range Cr(0)-Cr(VI) by electron energy loss spectroscopy

  • 1. Marine Geosciences Division, Naval Research Laboratory, Stennis Space Center, MS 39529 (United States)
  • 2. Oceanography Division, Naval Research Laboratory, Stennis Space Center, MS 39529 (United States)

Description

Chromium is a redox active 3d transition metal with a wide range of valences (-2 to +6) that control the geochemistry and toxicity of the element. Therefore, techniques that measure Cr valence are important bio/geochemical tools. Until now, all established methods to determine Cr valence were bulk techniques with many specific to a single, or at best, only a few oxidation state(s). We report an electron energy loss spectroscopy (EELS) technique along with an extensive suite of affined reference spectra that together, unlike other methods, can determine Cr valence (or at least constrain the possible valences) at high-spatial resolution (tens-of-nanometer scale) across a wide valence range, Cr(0)-Cr(VI). Fine structure of Cr-L2,3 edges was parametrized by measurement of the chemical shift of the L3 edge and the ratio of integrated intensity under the L3 and L2 edges. These two parameterizations were correlated to Cr valence and also the d n orbital configuration which has a large influence on L-edge fine structure. We demonstrate that it is not possible to unambiguously determine Cr valence from only one fine-structure parameterization which is the method employed to determine metal valence by nearly all previous EELS studies. Rather, multiple fine-structure parameterizations must be used together if the full range of possible Cr valences is considered. However even with two parameterizations, there are limitations. For example, distinguishing Cr(IV) from Cr(III) is problematic and it may be difficult to distinguish low-spin Cr(II) from Cr(III). Nevertheless, when Cr is known to be divalent, low- and high-spin d n orbital configurations can be readily distinguished

Additional details

Identifiers

DOI
10.1016/j.ultramic.2006.02.005;
PII
S0304-3991(06)00019-2;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
106
Journal Issue
7
Journal Page Range
p. 561-573
ISSN
0304-3991
CODEN
ULTRD6

INIS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.