Chemically deposited CdS films in an ammonia-free cadmium-sodium citrate system
Description
In this work, we report the properties of chemically deposited CdS thin films in a cadmium-sodium citrate system. This chemical bath deposition process does not employ ammonia. We deposited four series of films at different cadmium content in the chemical bath process and determined their properties. The obtained information can be very useful for the optimization of the deposition process in order to reduce the amount of toxic chemical waste, mainly Cd-containing waste. The structural and optical properties of the CdS films were determined from X-ray diffraction, optical transmission and reflection spectroscopy and scanning electron microscopy measurements. We found that the properties of the films are very sensitive to the amount of cadmium in the deposition process. The process allows the deposition of good quality CdS thin films using 1.12, 0.84 and 0.76 mg of cadmium per milliliter of reaction solution
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2003.11.169;
- PII
- S004060900301767X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 457
- Journal Issue
- 2
- Journal Page Range
- p. 278-284
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37016884
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CADMIUM SULFIDES; CHEMICAL WASTES; CITRATES; DEPOSITION; LATTICE PARAMETERS; OPTICAL PROPERTIES; REFLECTION; SCANNING ELECTRON MICROSCOPY; SODIUM COMPOUNDS; SPECTROSCOPY; THIN FILMS; TRANSMISSION; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CADMIUM COMPOUNDS; CARBOXYLIC ACID SALTS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; INORGANIC PHOSPHORS; MICROSCOPY; NONRADIOACTIVE WASTES; PHOSPHORS; PHYSICAL PROPERTIES; SCATTERING; SULFIDES; SULFUR COMPOUNDS; WASTES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.