Published February 1, 2018 | Version v1
Journal article

Research on criticality analysis method of CNC machine tools components under fault rate correlation

  • 1. School of Mechanical Science and Engineering, Jilin University, Changchun, 130000 (China)

Description

In order to determine the key components of CNC machine tools under fault rate correlation, a system component criticality analysis method is proposed. Based on the fault mechanism analysis, the component fault relation is determined, and the adjacency matrix is introduced to describe it. Then, the fault structure relation is hierarchical by using the interpretive structure model (ISM). Assuming that the impact of the fault obeys the Markov process, the fault association matrix is described and transformed, and the Pagerank algorithm is used to determine the relative influence values, combined component fault rate under time correlation can obtain comprehensive fault rate. Based on the fault mode frequency and fault influence, the criticality of the components under the fault rate correlation is determined, and the key components are determined to provide the correct basis for equationting the reliability assurance measures. Finally, taking machining centers as an example, the effectiveness of the method is verified. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/307/1/012023

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
307
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1757-899X

Conference

Title
International Conference on Mechanical Engineering and Applied Composite Materials
Dates
23-24 Nov 2017
Place
Hong Kong (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52077850
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALGORITHMS; MACHINING; MARKOV PROCESS; MATRICES; RELIABILITY
Descriptors DEC
MATHEMATICAL LOGIC; STOCHASTIC PROCESSES