Published December 4, 2015 | Version v1
Journal article

Selective enhancement of individual cantilever high resonance modes

  • 1. IMM-Instituto de Microelectrónica de Madrid (CNM-CSIC), Isaac Newton 8, PTM, E-28760 Tres Cantos, Madrid (Spain)

Description

Multifrequency atomic force microscopy (AFM) in liquid media where several eigenmodes or harmonics are simultaneously excited is improving the performance of the scanning probe techniques in biological studies. As a consequence, an important effort is being made to search for a reliable, efficient and strong cantilever high mode excitation method that operates in liquids. In this work we present (theoretical and experimentally) a technique for improving the efficiency of the most common excitation methods currently used in AFM operated in liquids: photothermal, torque (MAC Mode™) and magnetostriction. By etching specific areas of the cantilever coating, the oscillation amplitude (both flexural and torsional) of each specific eigenmode increases, leading to an improvement in signal to noise ratio of the multifrequency techniques. As an alternative, increment in high mode oscillation amplitude is also obtained by Ga+ ion implantation in the specific areas of the magnetic material. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/26/48/485706

Additional details

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
26
Journal Issue
48
Journal Page Range
[6 p.]
ISSN
0957-4484

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48034214
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; EXCITATION; GALLIUM IONS; ION IMPLANTATION; LIQUIDS; MAGNETIC MATERIALS; OSCILLATION MODES
Descriptors DEC
CHARGED PARTICLES; ENERGY-LEVEL TRANSITIONS; FLUIDS; IONS; MATERIALS; MICROSCOPY