Published 2018
| Version v1
Miscellaneous
Characterization OF Silicon Microstrip Sensors AND Flexible Microcables For The CBM Experiment
Creators
- 1. Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv (Ukraine)
- 2. GSI Helmholtzzentrum for Schwerionenforschung, Darmstadt (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (Ukrainian)
- Doslyidzhennya myikrostryipovikh kremnyijevikh sensoryiv ta korotkikh gnuchkikh myikrokabyiliv dlya eksperimentu CBM
Publishing Information
- Publisher
- INR NAN of Ukraine
- Imprint Place
- Kyiv (Ukraine)
- Imprint Title
- Book of abstract of 15th annual scientific conference of Institute for Nuclear Research of National Academy of Sciences of Ukraine
- Imprint Pagination
- 240 p.
- Journal Page Range
- p. 82-83
- Report number
- INIS-UA--200
Conference
- Title
- 15. annual scientific conference of Institute for Nuclear Research of National Academy of Sciences of Ukraine
- Original Conference Title
- Tezi dopovyidej 15 shchoryichnoyi naukovoyi konferentsyiyi Yinstitutu Yadernikh Doslyidzhen' Natsyional'noyi Akademyiyi Nauk Ukrayini
- Dates
- 16-20 Apr 2018
- Place
- Kyiv (Ukraine)
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 49075800
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- CABLES; MICROELECTRONICS; PARTICLE TRACKS; PERFORMANCE TESTING; READOUT SYSTEMS; SI MICROSTRIP DETECTORS; SIGNAL-TO-NOISE RATIO; SIS SYNCHROTRON
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; DIMENSIONLESS NUMBERS; HEAVY ION ACCELERATORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SYNCHROTRONS; TESTING
Optional Information
- Notes
- Imprint:15. shchoryichna naukova konferentsyiya Yinstitutu Yadernikh Doslyidzhen' Natsyional'noyi Akademyiyi Nauk Ukrayini