Published December 2019 | Version v1
Journal article Metadata-only

Surface composition of ion bombarded nickel based alloys

Creators

  • 1. Faculty of Physics, Moscow State University, 119991 Moscow (Russian Federation)
  • 2. IONTOF GmbH, Münster (Germany)
  • 3. Eindhoven University of Technology (Netherlands)

Description

The composition of NixPdy (x, y = 1, 5) and NiMoRe alloys irradiated by 3 and 4 keV Ar+ ions along the normal to the sample surface was investigated in situ by low energy ion scattering spectroscopy (LEIS). The analysis was performed using a 5 keV Ne+ ion beam. It was found that the composition of the topmost layer of bombarded NixPdy alloys nearly corresponds to the alloy stoichiometry. In the case of irradiation of the NiMoRe alloy, a surface enrichment with the heavier components (Mo and Re) was found. The thermally activated Gibbsian segregation in NiPd and NiPd5 alloys was also studied using LEIS.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2019.02.008

Additional details

Identifiers

DOI
10.1016/j.nimb.2019.02.008;
PII
S0168583X19300795;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
460
Journal Page Range
p. 180-184
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
10. Swift Heavy Ions in Matter; 28. International Conference on Atomic Collisions in Solids
Acronym
SHIM-ICACS 2018
Dates
1-7 Jul 2018
Place
Caen (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54122690
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGON IONS; ION BEAMS; IRRADIATION; NEON IONS; NICKEL BASE ALLOYS; SCATTERING; SPECTROSCOPY; STOICHIOMETRY; SURFACES
Descriptors DEC
ALLOYS; BEAMS; CHARGED PARTICLES; IONS; NICKEL ALLOYS; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.