Published 2010 | Version v1
Journal article Metadata-only

Application of genetic algorithms to surface x-ray diffraction analysis

Creators

  • 1. Departamento de Fisica de la Materia Condensada and Instituto Universitario de Ciencia de Materiales 'Nicolas Cabrera', Universidad Autonoma de Madrid, 28049 Madrid (Spain)
  • 2. Departamento de Fisica, Universidad de Oviedo-CINN, c/ Calvo Sotelo s/n, 33007 Oviedo (Spain)

Description

no abstract available

Additional details

Identifiers

URL
https://www.synchrotron.org.pl/publ/publ/biulet/vo09/p083-Martinez-Blanco.pdf;

Publishing Information

Journal Title
Synchrotron Radiation in Natural Science
Journal Volume
9
Journal Issue
1-2
Journal Page Range
p. 83
ISSN
1644-7190

Conference

Title
10. International School and Symposium on Synchrotron Radiation in Natural Science
Acronym
ISSNRS-10
Dates
6-11 Jun 2010
Place
Szklarska Poreba (Poland)

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
43006080
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE; S97: MATHEMATICAL METHODS AND COMPUTING;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
ALGORITHMS; COMPUTER CALCULATIONS; CRYSTAL-PHASE TRANSFORMATIONS; DATA ANALYSIS; OPTIMIZATION; SURFACES; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MATHEMATICAL LOGIC; PHASE TRANSFORMATIONS; SCATTERING

Optional Information

Notes
4 refs.