Published 2007
| Version v1
Miscellaneous
Quantum-size effect under reflection condition of average-energy electron diffraction
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Квантовый размерный эффект в условиях дифракции электронов средних энергий на отражение
Publishing Information
- Publisher
- IK RAN
- Imprint Place
- Moscow (Russian Federation)
- Imprint Title
- The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts
- Imprint Pagination
- 650 p.
- Journal Page Range
- p. 471
- Report number
- INIS-RU--507
Conference
- Title
- 6. National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation
- Original Conference Title
- VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007)
- Acronym
- RSNEh 2007
- Dates
- 12-17 Nov 2007
- Place
- Moscow (Russian Federation)
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 39080081
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ANGULAR DISTRIBUTION; COMPUTERIZED SIMULATION; ELECTRON DIFFRACTION; KEV RANGE 01-10; REFLECTION; THICKNESS; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; DISTRIBUTION; ENERGY RANGE; FILMS; KEV RANGE; SCATTERING; SIMULATION
Optional Information
- Notes
- Imprint:VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007). Prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov. Tezisy dokladov