Published 2007 | Version v1
Miscellaneous

Quantum-size effect under reflection condition of average-energy electron diffraction

  • 1. Inst. Kristallografii RAN, Moscow (Russian Federation)

Description

no abstract available

Part of:
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts

Additional details

Additional titles

Original title (Russian)
Квантовый размерный эффект в условиях дифракции электронов средних энергий на отражение

Publishing Information

Publisher
IK RAN
Imprint Place
Moscow (Russian Federation)
Imprint Title
The VI National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation (RSNEh 2007). The continuation of All-Union conferences on X-ray application for material investigation. Book of abstracts
Imprint Pagination
650 p.
Journal Page Range
p. 471
Report number
INIS-RU--507

Conference

Title
6. National conference on application of X-ray, synchrotron radiations, neutrons and electrons for material investigation
Original Conference Title
VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007)
Acronym
RSNEh 2007
Dates
12-17 Nov 2007
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
39080081
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
ANGULAR DISTRIBUTION; COMPUTERIZED SIMULATION; ELECTRON DIFFRACTION; KEV RANGE 01-10; REFLECTION; THICKNESS; THIN FILMS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; DISTRIBUTION; ENERGY RANGE; FILMS; KEV RANGE; SCATTERING; SIMULATION

Optional Information

Notes
Imprint:VI Natsional'naya konferentsiya po primeneniyu rentgenovskogo, sinkhrotronnogo izluchenij, nejtronov i ehlektronov dlya issledovaniya materialov (RSNEh 2007). Prodolzhenie Vsesoyuznykh soveshchanij po primeneniyu rentgenovskikh luchej dlya issledovaniya materialov. Tezisy dokladov