Published March 1, 2018
| Version v1
Journal article
Error correcting circuit design with carbon nanotube field effect transistors
- 1. Graduate School, Air Force Engineering University, No.1 East Changle Road, Xi'an 710051, Shaanxi (China)
- 2. First Aviation University of Air Force, No.23 Aviation Road, Xinyang 464000, Henan (China)
Description
In this work, a parallel error correcting circuit based on (7, 4) Hamming code is designed and implemented with carbon nanotube field effect transistors, and its function is validated by simulation in HSpice with the Stanford model. A grouping method which is able to correct multiple bit errors in 16-bit and 32-bit application is proposed, and its error correction capability is analyzed. Performance of circuits implemented with CNTFETs and traditional MOSFETs respectively is also compared, and the former shows a 34.4% decrement of layout area and a 56.9% decrement of power consumption. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/986/1/012038Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 986
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1742-6596
Conference
- Title
- 19. Annual Conference and 8. International Conference of Chinese Society of Micro/Nano Technology
- Acronym
- CSMNT2017
- Dates
- 26-29 Oct 2017
- Place
- Dalian (China)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52075428
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON NANOTUBES; CORRECTIONS; DESIGN; ERRORS; MOSFET; PERFORMANCE; SIMULATION
- Descriptors DEC
- CARBON; ELEMENTS; FIELD EFFECT TRANSISTORS; MOS TRANSISTORS; NANOSTRUCTURES; NANOTUBES; NONMETALS; SEMICONDUCTOR DEVICES; TRANSISTORS