Published March 1, 2018 | Version v1
Journal article

Error correcting circuit design with carbon nanotube field effect transistors

  • 1. Graduate School, Air Force Engineering University, No.1 East Changle Road, Xi'an 710051, Shaanxi (China)
  • 2. First Aviation University of Air Force, No.23 Aviation Road, Xinyang 464000, Henan (China)

Description

In this work, a parallel error correcting circuit based on (7, 4) Hamming code is designed and implemented with carbon nanotube field effect transistors, and its function is validated by simulation in HSpice with the Stanford model. A grouping method which is able to correct multiple bit errors in 16-bit and 32-bit application is proposed, and its error correction capability is analyzed. Performance of circuits implemented with CNTFETs and traditional MOSFETs respectively is also compared, and the former shows a 34.4% decrement of layout area and a 56.9% decrement of power consumption. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/986/1/012038

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
986
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
19. Annual Conference and 8. International Conference of Chinese Society of Micro/Nano Technology
Acronym
CSMNT2017
Dates
26-29 Oct 2017
Place
Dalian (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52075428
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CARBON NANOTUBES; CORRECTIONS; DESIGN; ERRORS; MOSFET; PERFORMANCE; SIMULATION
Descriptors DEC
CARBON; ELEMENTS; FIELD EFFECT TRANSISTORS; MOS TRANSISTORS; NANOSTRUCTURES; NANOTUBES; NONMETALS; SEMICONDUCTOR DEVICES; TRANSISTORS