Published 1984
| Version v1
Book
New developments in silicon detectors
- 1. European Organization for Nuclear Research, Geneva (Switzerland)
- 2. Max-Planck-Institut fuer Physik und Astrophysik, Muenchen (Germany, F.R.)
Description
These proceedings contain the articles presented at the named symposium. These concern applications of silicon detectors, detector technology, electronics and readout methods, and integrated electronics. See hints under the relevant topics. (HSI)
Additional details
Additional titles
- Subtitle (English)
- Proceedings
Publishing Information
- Publisher
- North-Holland.
- Imprint Place
- Amsterdam (Netherlands)
- Imprint Pagination
- 229 p.
- Journal Volume
- 226
- Journal Issue
- 1
- Series
- CODEN: NIMRD.;Nucl. Instrum. Methods Phys. Res., Sect. A.
- ISSN
- 0167-5087
Conference
- Title
- New developments in silicon detectors.
- Acronym
- 2. European symposium on semiconductor detectors
- Dates
- 14-16 Nov 1983.
- Place
- Muenchen (Germany, F.R.).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 16014918
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA DETECTION; BIOMEDICAL RADIOGRAPHY; CHARGE-COUPLED DEVICES; COLLIDING BEAMS; COMPUTERIZED TOMOGRAPHY; COUNTING CIRCUITS; CRYSTAL GROWTH; DRIFT CHAMBERS; ELECTRON DETECTION; ELECTRON SPECTROMETERS; FABRICATION; FEDERAL REPUBLIC OF GERMANY; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; INTEGRATED CIRCUITS; ION DETECTION; LI-DRIFTED SI DETECTORS; MEETINGS; POSITION SENSITIVE DETECTORS; PREAMPLIFIERS; REACTOR CONTROL SYSTEMS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SILICON; SURFACE BARRIER DETECTORS; TARGET CHAMBERS; TELESCOPE COUNTERS; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ACCELERATOR FACILITIES; AMPLIFIERS; BEAMS; CHARGED PARTICLE DETECTION; CHEMICAL ANALYSIS; COHERENT SCATTERING; CONTROL SYSTEMS; DETECTION; DEVELOPED COUNTRIES; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; EUROPE; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MEDICINE; MULTIWIRE PROPORTIONAL CHAMBER; NONDESTRUCTIVE ANALYSIS; PROPORTIONAL COUNTERS; RADIATION DETECTION; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMIMETALS; SPECTROMETERS; TOMOGRAPHY; X-RAY EMISSION ANALYSIS