Published December 1994
| Version v1
Journal article
Advances and trends on total reflection x-ray fluorescence spectrometry applied in element ultra traces analysis
Creators
- 1. Comision Chilena de nergia Nuclear, Santiago (Chile). Centro de Estudios Nucleares La Reina
Description
Short communication
Additional details
Additional titles
- Original title (Spanish)
- Avances y tendencias de la espectrometria de rayos x por reflexion total aplicada al analisis de ultratrazas
Publishing Information
- Journal Title
- Nucleotecnica
- Journal Volume
- 14
- Journal Issue
- 27
- Journal Page Range
- p. 53.
- ISSN
- 0716-0054
- CODEN
- NUCLEQ
Conference
- Title
- 4. Latin American Seminar on X-Ray Techniques Analysis.
- Acronym
- SARX 94
- Dates
- 24-27 Oct 1994.
- Place
- Punta de Tralca (Chile).
INIS
- Country of Publication
- Chile
- Country of Input or Organization
- Chile
- INIS RN
- 27012714
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BENCH-SCALE EXPERIMENTS; COMPARATIVE EVALUATIONS; ELEMENTS; SAMPLE PREPARATION; SPECIFICATIONS; TRACE AMOUNTS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; EVALUATION; IONIZING RADIATIONS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; X-RAY EMISSION ANALYSIS