Structural studies of amorphous In-Se by EXAFS

Amorphous In-Se films containing 50, 60 and 66 at.% Se, prepared by vacuum evaporation, have been studied by extended X-ray absorption fine structure (EXAFS) at the In K-edge. A least-squares fitting procedure has been used to derive structural information about the In environment. The results indicate that In is tetrahedrally coordinated and for In50Se50 each In atom has one In nearest neighbor at 2.75 Angst and three Se nearest neighbors at 2.63 Angst. The number of In-In bonds decreases with increasing Se content