Published August 2013 | Version v1
Journal article

In situ probing of the evolution of irradiation-induced defects in copper

  • 1. Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)
  • 2. Sandia National Laboratories, Albuquerque, NM 87185 (United States)

Description

Through in situ Cu3+ ion irradiation at room temperature in a transmission electron microscope (TEM), we have investigated the evolution of defect clusters as a function of the radiation dose at different distances from the 3 {1 1 2} incoherent twin boundary (ITB) in Cu. Post in situ ion irradiation, high resolution TEM was used to explore the types of defects, which are composed of a high-density of vacancy stacking fault tetrahedra (SFT) and sparsely distributed interstitial Frank loops. During irradiation, defect clusters evolve through four stages: (i) incubation, (ii) non-interaction, (iii) interaction and (iv) saturation; and the corresponding density was observed to initially increase with irradiation dose and then approach saturation. No obvious denuded zone is observed along the 3 {1 1 2} ITB and the configuration of defects at the boundary displays as truncated SFTs. Several defect evolution models have been proposed to explain the observed phenomena

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2013.04.013

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2013.04.013;
PII
S0022-3115(13)00613-2;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
439
Journal Issue
1-3
Journal Page Range
p. 185-191
ISSN
0022-3115
CODEN
JNUMAM

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45070071
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COPPER; COPPER IONS; DEFECTS; DENSITY; INTERACTIONS; IRRADIATION; RADIATION DOSES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
CHARGED PARTICLES; DOSES; ELECTRON MICROSCOPY; ELEMENTS; IONS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.