In situ probing of the evolution of irradiation-induced defects in copper
Creators
- 1. Los Alamos National Laboratory, Los Alamos, NM 87545 (United States)
- 2. Sandia National Laboratories, Albuquerque, NM 87185 (United States)
Description
Through in situ Cu3+ ion irradiation at room temperature in a transmission electron microscope (TEM), we have investigated the evolution of defect clusters as a function of the radiation dose at different distances from the 3 {1 1 2} incoherent twin boundary (ITB) in Cu. Post in situ ion irradiation, high resolution TEM was used to explore the types of defects, which are composed of a high-density of vacancy stacking fault tetrahedra (SFT) and sparsely distributed interstitial Frank loops. During irradiation, defect clusters evolve through four stages: (i) incubation, (ii) non-interaction, (iii) interaction and (iv) saturation; and the corresponding density was observed to initially increase with irradiation dose and then approach saturation. No obvious denuded zone is observed along the 3 {1 1 2} ITB and the configuration of defects at the boundary displays as truncated SFTs. Several defect evolution models have been proposed to explain the observed phenomena
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2013.04.013Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2013.04.013;
- PII
- S0022-3115(13)00613-2;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 439
- Journal Issue
- 1-3
- Journal Page Range
- p. 185-191
- ISSN
- 0022-3115
- CODEN
- JNUMAM
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45070071
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COPPER; COPPER IONS; DEFECTS; DENSITY; INTERACTIONS; IRRADIATION; RADIATION DOSES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; DOSES; ELECTRON MICROSCOPY; ELEMENTS; IONS; METALS; MICROSCOPY; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.