Published December 2020
| Version v1
Journal article
The future of crystallography led by electron beams
Description
I will describe the future direction of electron crystallography, by focusing on how electron beams contribute uniquely for atomic structure determinations. Both for electron diffraction and microscopy, the key lies on how we make the best use of dynamical scattering effects, which are significant for electrons compared with other probes including X-ray. (author)
Availability note (English)
Available from DOI: https://doi.org/10.5940/jcrsj.62.248Additional details
Additional titles
- Original title (Japanese)
- 電子線が拓く結晶学の未来
Identifiers
- DOI
- 10.5940/jcrsj.62.248;
Publishing Information
- Journal Title
- Nippon Kessho Gakkai-Shi (Online)
- Journal Volume
- 62
- Journal Issue
- 4
- Series
- 雑誌名:日本結晶学会誌
- Journal Page Range
- p. 248-252
- ISSN
- 1884-5576
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 52100661
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CRYSTAL DOPING; CRYSTALLOGRAPHY; ELECTRON BEAMS; ELECTRON DIFFRACTION; INTERATOMIC DISTANCES; LORENTZ FORCE; MAGNETIC FIELDS; SCREW DISLOCATIONS; SILICON; TRANSFER FUNCTIONS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; DISLOCATIONS; DISTANCE; ELECTRON MICROSCOPY; ELEMENTS; FUNCTIONS; LEPTON BEAMS; LINE DEFECTS; MICROSCOPY; PARTICLE BEAMS; SCATTERING; SEMIMETALS
Optional Information
- Notes
- 28 refs., 6 figs.