Simulation of innovative high efficiency perovskite solar cell with Bi-HTL: NiO and Si thin films
- 1. School of Electronics and Information Engineering, Hebei University of Technology, Tianjin, 30040, PR (China)
Description
The nickel oxide based planar heterojunction perovskite solar cell (PSC) is considered potentially stable, while its efficiency has not yet shown outstanding. However, by using double hole transport layers, a nickel oxide layer and a crystalline silicon layer, the paper reports the PSC reaches high efficiency of over 35% (JSC = 35.87 mA/cm2, VOC = 1.2 V, FF = 81.7%) according to theoretical calculation. The relationship between thickness, doping concentration, work function and efficiency is analyzed. It is suggested that the nickel oxide film can block electrons from entering hole transport layer (HTL) to recombining with holes so that reducing carriers recombination and improving solar cell performance in the PSC with the structure of TiO2/CH3NH3PbI3/NiO/Si.
Additional details
Identifiers
- DOI
- 10.1016/j.solener.2019.05.017;
- PII
- S0038092X19304803;
Publishing Information
- Journal Title
- Solar Energy
- Journal Volume
- 186
- Journal Page Range
- p. 323-327
- ISSN
- 0038-092X
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55104616
- Subject category
- S14: SOLAR ENERGY;
- Descriptors DEI
- CARRIERS; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; HOLES; NICKEL OXIDES; PERFORMANCE; PEROVSKITE; SILICON; SOLAR CELLS; THICKNESS; THIN FILMS; TITANIUM OXIDES; WORK FUNCTIONS
- Descriptors DEC
- CHALCOGENIDES; DIMENSIONLESS NUMBERS; DIMENSIONS; DIRECT ENERGY CONVERTERS; ELEMENTS; EQUIPMENT; FILMS; FUNCTIONS; MINERALS; NICKEL COMPOUNDS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PEROVSKITES; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; SEMIMETALS; SIMULATION; SOLAR EQUIPMENT; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 International Solar Energy Society. Published by Elsevier Ltd. All rights reserved.